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Variation Aware Analog and Mixed-Signal Circuit Design in by Michael Fulde

By Michael Fulde

Since scaling of CMOS is attaining the nanometer zone critical obstacles implement the advent of novel fabrics, gadget architectures and equipment innovations. Multi-gate units utilising high-k gate dielectrics are regarded as promising resolution overcoming those scaling boundaries of traditional planar bulk CMOS. Variation acutely aware Analog and Mixed-Signal Circuit layout in rising Multi-Gate CMOS applied sciences provides a know-how orientated review of analog and mixed-signal circuits in rising high-k and multi-gate CMOS applied sciences. final the distance from expertise to layout an in depth perception into circuit functionality trade-offs with regards to multi-gate and high-k machine specifics is equipped. the hot impression of brief threshold voltage diversifications is defined with an an identical version that permits a scientific evaluate of the implications on circuit point and the improvement of countermeasures to atone for functionality degradation in comparators and A/D converters. Key analog, mixed-signal and RF construction blocks are discovered in high-k multi-gate expertise and benchmarked opposed to planar bulk. functionality and quarter merits, enabled through constructive multi-gate equipment houses are analytically and experimentally quantified for reference circuits, operational amplifiers and D/A converters. this is often in keeping with first time silicon investigations of advanced mixed-signal development blocks as D/A converter and PLL with multi-gate units. As one other first, the combination of tunnel transistors in a multi-gate method is defined, permitting units with promising scaling and analog homes. in response to those units a singular reference circuit is proposed which positive factors low strength consumption.

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Extra info for Variation Aware Analog and Mixed-Signal Circuit Design in Emerging Multi-Gate CMOS Technologies

Sample text

The model can be easily extended to cover multiple time constants [76]. The thermal parameters Rth and Cth are extracted by pulsed measurements, RF small signal measurements [77] or device simulations [76]. For typical FinFET device dimensions Rth is in the range of 10◦ K/mW to 100◦ K/mW, the respective time constants are in the 10–100 ns regime [50, 76]. 15(a) shows that the simulations fit well the measured data. Similar to charge trapping self-heating yields history dependent transistor behavior and potential dynamic mismatch effects.

Consequently the mean dynamic VT shift of positive and negative input device is equal and the dynamic offset is canceled out, assuming that the sampling time is smaller than the (de)trapping time constants. 13 shows the simulated comparator response with switched input under worst case conditions (1st input value = +VDD , 2nd input value = +3 mV). Two versions of the comparator shown in Fig. 6 are simulated, in simulation (a) only the input of the 1st gain stage is switched, whereas in simulation (b) the input of the 1st and 2nd stage is switched.

The basic concept of A/D converters is the use of oversampling and feedback to improve the resolution of a coarse quantizer [93]. Oversampling lowers the in-band quantization noise, since the total noise power is distributed over a wider band. The employment of feedback allows to shape the quantization noise out of the band of interest, whereas the signal is not affected. A digital decimation filter is required to remove the out of band noise. The block level schematic of a first order single bit modulator is shown in Fig.

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